Multiple regression analysis of a patent's citation frequency and quantitative characteristics: The case of Japanese patents

Scientometrics

Volumn 96, Issue 1, 2013, Pages 365-379

  Yoshikane, Fuyuki ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Citation frequency; Japan; Patent citation; Regression analysis

Indexed keywords

EID: 84879161118     PISSN: 01389130     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11192-013-0953-4     Document Type: Article

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