Soft X-ray absorption spectroscopy and resonant inelastic X-ray scattering spectroscopy below 100 eV: Probing first-row transition-metal M-edges in chemical complexes

Journal of Synchrotron Radiation

Volumn 20, Issue 4, 2013, Pages 614-619

  Wang, Hongxin ^a,b   Young, Anthony T ^b   Guo, Jinghua ^b   Cramer, Stephen P ^a,b   Friedrich, Stephan ^c   Braun, Artur ^d   Gu, Weiwei ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^d SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

3d metal M edge; resonance inelastic X ray scattering (RIXS); soft X ray absorption spectroscopy (XAS); superconducting tunnel junction (STJ) X ray detector

Indexed keywords

3D METALS; INELASTIC X RAY SCATTERING; L-EDGE SPECTROSCOPY; RESONANT INELASTIC X-RAY SCATTERING; SOFT X-RAY ABSORPTION SPECTROSCOPIES; SPECTRAL INFORMATION; SUPERCONDUCTING TUNNEL JUNCTION; X-RAY DETECTOR;

METAL COMPLEXES; SUPERCONDUCTING DEVICES; THREE DIMENSIONAL COMPUTER GRAPHICS; TRANSITION METALS; X RAY ABSORPTION SPECTROSCOPY; X RAY APPARATUS;

X RAY SCATTERING;

METAL;

3D METAL M-EDGE; ARTICLE; CHEMISTRY; RADIATION SCATTERING; RESONANCE INELASTIC X-RAY SCATTERING (RIXS); SEMICONDUCTOR; SOFT X-RAY ABSORPTION SPECTROSCOPY (XAS); SUPERCONDUCTING TUNNEL JUNCTION (STJ) X-RAY DETECTOR; X RAY ABSORPTION SPECTROSCOPY;

3D METAL M-EDGE; RESONANCE INELASTIC X-RAY SCATTERING (RIXS); SOFT X-RAY ABSORPTION SPECTROSCOPY (XAS); SUPERCONDUCTING TUNNEL JUNCTION (STJ) X-RAY DETECTOR;

METALS; SCATTERING, RADIATION; SEMICONDUCTORS; X-RAY ABSORPTION SPECTROSCOPY;

EID: 84879155757     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049513003142     Document Type: Article

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