Sensitivity and S/N-ratio of superconducting high-resolution X-ray spectrometers

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART I, 2005, Pages 613-617

  Drury, Owen B ^a,b   Friedrich, Stephan ^a,b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Sensitivity; Superconducting devices; Superconducting tunnel junctions; X ray spectroscopy detectors

Indexed keywords

ABSORPTION SPECTROSCOPY; FLUORESCENCE; PHOTONS; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO; SUPERCONDUCTING DEVICES; TRANSITION METALS; TUNNEL JUNCTIONS; X RAY SPECTROSCOPY;

L-EDGE SPECTROSCOPY; SENSITIVITY; SUPERCONDUCTING TUNNEL JUNCTIONS (STJ); X-RAY SPECTROSCOPY DETECTORS;

X RAY SPECTROMETERS;

EID: 22044445135     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.849959     Document Type: Conference Paper

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