Quantifying residual hydrogen adsorption in low-temperature STMs

Surface Science

Volumn 615, Issue , 2013, Pages 80-87

  Natterer, F D ^a   Patthey, F ^a   Brune, H ^a  

^a EPFL   (Switzerland)

Author keywords

Hexagonal boron nitride; Hydrogen adsorption; Kondo effect; Low temperature scanning tunneling microscope; Residual gas; Titanium

Indexed keywords

CONTAMINATION PROBLEM; DIFFERENTIAL CONDUCTANCES; HEXAGONAL BORON NITRIDE; HYDROGEN ADSORPTION; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPES; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPY; RESIDUAL GAS; TRANSITION METAL ATOMS;

BORON NITRIDE; CRYOSTATS; HYDROGEN; KONDO EFFECT; SCANNING TUNNELING MICROSCOPY; TEMPERATURE; TITANIUM; TRANSITION METALS;

HYDROGENATION;

EID: 84878799205     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2013.04.008     Document Type: Article

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