Discussion: Bayesian reliability estimation based on a weibull stress-strength model for aged power system components subjected to voltage surges

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 13, Issue 4, 2006, Pages 935-937

  Chiodo, E ^a,b   Mazzanti, G ^a,b   Nadarajah, S ^c   Kotz, S ^d  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

^c UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^d GEORGE WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84878746022     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2006.1667755     Document Type: Article

References (5)

1. E. Chiodo, G. Mazzanti, "Bayesian reliability estimation based on a Weibull stress-strength model for aged power system components subjected to voltage surges", IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 13, n. 1, pp. 146-159, February 2006.
2. A. P. Prudnikov, Y. A. Brychkov and O. I. Marichev, Integrals and Series, volume 1, Gordon and Breach Science Publishers, Amsterdam, 1986.
3. I. S. Gradshteyn and I. M. Ryzhik, Table of Integrals, Series, and Products, sixth edition, Academic Press, San Diego, CA, 2000.
4. I.A. Ushakov, R.A. Harrison, Handbook of Reliability Engineering", J. Wiley, New York (USA), 1994.
5. K.C. Kapur, L.R. Lamberson, Reliability in Engineering Design, J. Wiley, New York (USA), 1976.