A Bayesian Hidden Markov Model-based approach for anomaly detection in electronic systems

IEEE Aerospace Conference Proceedings

Volumn , Issue , 2013, Pages

  Dorj, Enkhjargal ^a   Chen, Chaochao ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATASTROPHIC FAILURES; COMPLEX ARCHITECTURES; COMPONENT FUNCTIONALITY; DATA-DRIVEN APPROACH; ELECTRONIC SYSTEMS; EXPERIMENTAL DATUM; MODEL BASED APPROACH; MODEL-BASED CLASSIFICATIONS;

DIGITAL STORAGE; ELECTRONICS ENGINEERING; INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

HIDDEN MARKOV MODELS;

EID: 84878738663     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2013.6497204     Document Type: Conference Paper

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