Morphological, topographical and FTIR characterizations of Pd-C films

Optica Applicata

Volumn 43, Issue 1, 2013, Pages 123-132

  Rymarczyk, Joanna ^a   Kaminska, Anna ^a   Keczkowska, Justyna ^b   Kozłowski, Mirosław ^a   Czerwosz, Elzbieta ^a  

^a TELE AND RADIO RESEARCH INSTITUTE   (Poland)

^b KIELCE UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Fullerene; Palladium nanocrystals; PVD

Indexed keywords

AFM; AFM IMAGE; FT-IR AND RAMAN; FT-IR CHARACTERIZATION; FTIR; NANO GRAINS; TECHNOLOGICAL PARAMETERS;

ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FULLERENES; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY;

TOPOGRAPHY;

EID: 84878682384     PISSN: 00785466     EISSN: None     Source Type: Journal    
DOI: 10.5277/oa130116     Document Type: Article

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