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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6002, Issue , 2005, Pages

Investigation of C60 films for surface finishing applications

(3) Jayatissa, Ahalapitiya H a Nadarajah, Arunan b Dutta, Achyut K c

a UNIVERSITY OF TOLEDO (United States)

b Toledo (United States)

c Banpil Photonics Inc (United States)

Author keywords

Atomic force microscopy; C60 Fullerenes; Optical transparency; Oxygen plasma; Thin films; X ray diffraction

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; EVAPORATION; GLASS; GRAPHITIZATION; OPTICAL PROPERTIES; SURFACE CHEMISTRY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

C60 FULLERENES; OPTICAL TRANSPARENCY; OXYGEN PLASMA;

FULLERENES;

EID: 33644649351 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.631051 Document Type: Conference Paper

Times cited : (3)

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