Fluorine-doped tin oxide surfaces modified by self-assembled alkanethiols for thin-film devices

Applied Surface Science

Volumn 279, Issue , 2013, Pages 67-70

  Alves, A C T ^a   Gomes, D J C ^a   Silva, J R ^a   Silva, G B ^a  

^a FEDERAL UNIVERSITY OF MATO GROSSO   (Brazil)

Author keywords

AFM; Fluorine doped tin oxide; Molecular electronics; SAMs; Self assembled; Thin films; Thiols

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; ELECTRODES; MOLECULAR ELECTRONICS; MOLECULES; NANOCOMPOSITES; OXIDE FILMS; THIN FILM CIRCUITS; THIN FILM DEVICES; THIN FILMS; TIN OXIDES; WETTING;

CHARGE TRAPPING EFFECT; CURRENT VOLTAGE ANALYSIS; FLUORINE DOPED TIN OXIDE; MOLECULAR-SCALE ELECTRONIC DEVICE; SAMS; SELF-ASSEMBLED; THIOLS; WETTING CONTACT ANGLES;

SELF ASSEMBLED MONOLAYERS;

EID: 84878554946     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.04.025     Document Type: Article

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