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Volumn 110, Issue 21, 2013, Pages

Magnetic structure of phase II in U(Ru0.96Rh0.04) 2Si2 determined by neutron diffraction under pulsed high magnetic fields

(13) Kuwahara, K a Yoshii, S b Nojiri, H b Aoki, D b,d Knafo, W c Duc, F c Fabreges X c Scheerer, G W c Frings, P c Rikken, G L J A c Bourdarot, F d Regnault, L P d Flouquet, J d

a IBARAKI UNIVERSITY (Japan)

b TOHOKU UNIVERSITY (Japan)

c CNRS (France)

d UNIV GRENOBLE ALPES (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC ORDERS; FERRIMAGNETIC STRUCTURE; FIELD-INDUCED; HIDDEN ORDER; MAGNETIC FLUCTUATION; MAGNETIZATION PLATEAUS; NEUTRON DIFFRACTION MEASUREMENTS; PULSED HIGH MAGNETIC FIELD;

ANTIFERROMAGNETISM; MAGNETIC FIELDS; MAGNETIC MOMENTS; MAGNETIC STRUCTURE; NEUTRON DIFFRACTION; RHODIUM; SILICON;

SILICON WAFERS;

EID: 84878390855 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.110.216406 Document Type: Article

Times cited : (35)

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