Convex relaxation for grain segmentation at atomic scale

VMV 2010 - Vision, Modeling and Visualization

Volumn , Issue , 2010, Pages 179-186

  Boerdgen, M ^a   Berkels, B ^b   Rumpf, M ^b   Cremers, D ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONVEX RELAXATION; GRAIN SEGMENTATION; LATTICE ORIENTATIONS; LEVEL SET FORMULATIONS; MICROSCOPIC SIMULATION; SIMULATION IMAGES; TRANSMISSION ELECTRON MICROSCOPY IMAGES; VARIATIONAL APPROACHES;

GRAIN BOUNDARIES; SURFACE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; VISUALIZATION;

RELAXATION PROCESSES;

EID: 84878237324     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2312/PE/VMV/VMV10/179-186     Document Type: Conference Paper

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