Feature extraction of one port scattering parameters for single ended line testing

18th IMEKO World Congress 2006: Metrology for a Sustainable Development

Volumn 1, Issue , 2006, Pages 308-313

  Neus, Carine ^a   Boets, Patrick ^a   Van Biesen, Leo ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

Digital subscriber line (DSL); Feature extraction; Loop qualification; Single ended line testing (SELT); Transfer function estimation

Indexed keywords

DIGITAL SUBSCRIBER LINE (DSL); FEATURE EXTRACTION ALGORITHMS; ITERATIVE APPROACH; LOOP QUALIFICATION; MEASUREMENT TECHNIQUES; SECOND DERIVATIVES; SINGLE-ENDED LINE TESTING; TRANSFER FUNCTION ESTIMATION;

ALGORITHMS; DSL; FEATURE EXTRACTION; ITERATIVE METHODS; MODEMS; PLANNING; SCATTERING PARAMETERS; SUSTAINABLE DEVELOPMENT; TRANSFER FUNCTIONS; UNITS OF MEASUREMENT;

TELECOMMUNICATION LINES;

EID: 84877772425     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. T. Bostoen, P. Boets, M. Zekri, L. Van Biesen, T. Pollet and D. Rabijns, "Estimation of the Transfer Function of a Subscriber Loop by Means of One-Port Scattering Parameter Measurement at the Central Office", IEEE Journal on Selected Areas in Communication-Twisted Pair Transmission, Vol. 20, No. 5, pp936-948, June 2002.
2. S. Galli, D.L. Waring, "Loop Makeup Identification Via Single Ended Testing: Beyond Mere Loop Qualification", IEEE Journal on Selected Areas in Communication-Twisted Pair Transmission, Vol. 20, No. 5, pp923-935, June 2002.
3. th IEEE Instrumentation and Measurement Technology Conference, 20-22 May, 2003.
4. P. Boets, T. Bostoen, D. Gardan, and L. Van Biesen, "Single-Ended Line Testing - A White Box Approach", Proceeding of Wireless and Optimal Communication, Banff, Canada, 8-10 July, 2004.
5. T. Vermeiren, T. Bostoen, F. Louage, P. Boets, and X. O. Chebab, "Subscriber Loop Topology Classification by means of Time Domain Reflectometry", IEEE International Conference on Communications, Anchorage USA, 11-15 May, 2003.
6. X. Ochoa Chehab, "Expert System for Automated TDR Interpretation using a Double Level Generate-Test- Debug Approach", M.S. Thesis, Dept. ELEC, Vrije Universiteit Brussel, 2002.
7. C. Neus, "Feature Extraction of One Port Scattering Parameters for Single Ended Line Testing", Master Thesis, Dept. ELEC, Vrije Universiteit Brussel, 2004.