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Volumn 20, Issue 5, 2002, Pages 923-935

Loop makeup identification via single ended testing: Beyond mere loop qualification

Author keywords

Digital subscriber lines; Time domain reflectometry techniques; Twisted pair modeling

Indexed keywords

DIGITAL SUBSCRIBER LINES; LOOP MAKEUP IDENTIFICATION; TIME DOMAIN REFLECTOMETRY TECHNIQUES; TWISTED-PAIR MODELING;

EID: 0036601295     PISSN: 07338716     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSAC.2002.1007375     Document Type: Article
Times cited : (65)

References (11)
  • 7
    • 0005732475 scopus 로고    scopus 로고
    • Loop makeup identification via single ended testing: A maximum-likelihood approach
    • to be submitted
    • Galli, S.1
  • 8
    • 84866567012 scopus 로고    scopus 로고
    • The telcordia DSL spectral compatibility computer
    • Managed by Kenneth J. Kerpez


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.