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Volumn 20, Issue 5, 2002, Pages 923-935
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Loop makeup identification via single ended testing: Beyond mere loop qualification
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Author keywords
Digital subscriber lines; Time domain reflectometry techniques; Twisted pair modeling
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Indexed keywords
DIGITAL SUBSCRIBER LINES;
LOOP MAKEUP IDENTIFICATION;
TIME DOMAIN REFLECTOMETRY TECHNIQUES;
TWISTED-PAIR MODELING;
BANDWIDTH;
COMPUTER SIMULATION;
ELECTROMAGNETIC WAVE REFLECTION;
MATHEMATICAL MODELS;
OPTICAL VARIABLES MEASUREMENT;
QUALITY OF SERVICE;
SPURIOUS SIGNAL NOISE;
TELEPHONE LINES;
TELECOMMUNICATION CABLES;
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EID: 0036601295
PISSN: 07338716
EISSN: None
Source Type: Journal
DOI: 10.1109/JSAC.2002.1007375 Document Type: Article |
Times cited : (65)
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References (11)
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