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Volumn , Issue , 2012, Pages

MPI runtime error detection with MUST: Advances in deadlock detection

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS TIME; APPLICATION DEVELOPERS; AUTOMATED TOOLS; DEADLOCK DETECTION; GRAPH-BASED; GRAPH-BASED DETECTION; MESSAGE PASSING INTERFACE; PROGRAMMING ERRORS;

EID: 84877697102     PISSN: 21674329     EISSN: 21674337     Source Type: Conference Proceeding    
DOI: 10.1109/SC.2012.79     Document Type: Conference Paper
Times cited : (49)

References (15)
  • 6
    • 67650152037 scopus 로고    scopus 로고
    • MPI Application Development with MARMOT
    • Central Institute for Applied Mathematics, Jülich, Germany
    • B. Krammer and M. S. Müller, "MPI Application Development with MARMOT," in PARCO, vol. 33. Central Institute for Applied Mathematics, Jülich, Germany, 2005, pp. 893-900.
    • (2005) PARCO , vol.33 , pp. 893-900
    • Krammer, B.1    Müller, M.S.2
  • 10
    • 4644307632 scopus 로고    scopus 로고
    • Fast, Centralized Detection and Resolution of Distributed Deadlocks in the Generalized Model
    • S. Lee, "Fast, Centralized Detection and Resolution of Distributed Deadlocks in the Generalized Model," IEEE Trans. Softw. Eng., vol. 30, no. 9, pp. 561-573, 2004.
    • (2004) IEEE Trans. Softw. Eng. , vol.30 , Issue.9 , pp. 561-573
    • Lee, S.1
  • 11
    • 1342287000 scopus 로고    scopus 로고
    • Deadlock-Free Scheduling of Photolithography Equipment in Semiconductor Fabrication
    • Feb.
    • H. J. Yoon and D. Y. Lee, "Deadlock-Free Scheduling of Photolithography Equipment in Semiconductor Fabrication," Semiconductor Manufacturing, IEEE Transactions on, vol. 17, no. 1, pp. 42-54, Feb. 2004.
    • (2004) Semiconductor Manufacturing, IEEE Transactions on , vol.17 , Issue.1 , pp. 42-54
    • Yoon, H.J.1    Lee, D.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.