The use of differential EXAFS analysis for the determination of small structural differences between two closely-related ruthenium complexes

Journal of Physics: Conference Series

Volumn 430, Issue 1, 2013, Pages

  Gianolio, D ^a   Borfecchia, E ^b   Garino, C ^b   Ruiu, T ^b   Lamberti, C ^b   Salassa, L ^c  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^b UNIVERSITY OF TURIN   (Italy)

^c CIC BIOMAGUNE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; CURVE FITTING; DATA HANDLING; EXCITED STATES; INFORMATION ANALYSIS; X RAY ABSORPTION SPECTROSCOPY;

DIFFERENTIAL APPROACH; DIFFERENTIAL CURVE; INTER-ATOMIC DISTANCES; MOLECULAR COMPLEXES; RUTHENIUM COMPLEXES; STATIC CONDITIONS; STRUCTURAL DIFFERENCES; STRUCTURAL FEATURE;

RUTHENIUM COMPOUNDS;

EID: 84877315953     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/430/1/012125     Document Type: Conference Paper

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