Detection of electronic nematicity using scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 87, Issue 16, 2013, Pages

  Da Silva Neto, Eduardo H ^a   Aynajian, Pegor ^a   Baumbach, Ryan E ^b   Bauer, Eric D ^b   Mydosh, John ^c   Ono, Shimpei ^d   Yazdani, Ali ^a  

^a PRINCETON UNIVERSITY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c LEIDEN UNIVERSITY   (Netherlands)

^d CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84877013742     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.161117     Document Type: Article

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