Interference between competing tunneling channels and chemical resolution of STM

Surface Science

Volumn 552, Issue 1-3, 2004, Pages

  Nieminen, Jouko A ^c   Niemi, Eeva ^a   Rieder, Karl Heinz ^b  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

^c NONE

Author keywords

Carbon monoxide; Copper; Electrical transport (conductivity, resistivity, mobility, etc.); Green's function methods; Scanning tunneling microscopy; Tunneling

Indexed keywords

CARBON MONOXIDE; COPPER; EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC CONDUCTIVITY; ELECTRON TUNNELING; ELECTRONIC STRUCTURE; ENERGY GAP; GREEN'S FUNCTION; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY;

CHEMICAL RESOLUTION; TUNNELING CHANNELS;

SURFACE PHENOMENA;

EID: 1342306781     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.01.043     Document Type: Article

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