Impulse immunity test method for digital integrated circuits

Proceedings of the International Conference on Electromagnetic Interference and Compatibility

Volumn 2003-January, Issue , 2003, Pages 249-252

  Bakshi, S T ^a   Coenen, M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Circuit testing; Clocks; Degradation; Digital integrated circuits; Electrostatic discharge; IEC standards; Immune system; Immunity testing; Impulse testing; Integrated circuit testing

Indexed keywords

CLOCKS; DEGRADATION; ELECTRIC DISCHARGES; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVE INTERFERENCE; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; IMMUNE SYSTEM; IMPULSE TESTING; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; SIGNAL INTERFERENCE; STANDARDS;

CIRCUIT TESTING; IEC STANDARDS; IMMUNITY TEST; IMMUNITY TESTING; TEST METHOD;

DIGITAL INTEGRATED CIRCUITS;

EID: 84876928272     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEMIC.2003.238030     Document Type: Conference Paper

References (8)

1. St. Wendsche "Improving the statistical evaluation of immunity to electrical transients" Electromagnetic compatibility symposium proceedings. pp 89-94 Digest 97.
2. E. F. Habiger "ESD-immunity testing to IEC 801-2 the reproducibility of the test results evaluated from a statistical point of view" Electromagnetic compatibility symposium proceedings pp 645-648 Digest 95.
3. R. Vick, E.Habiger "Evaluations of microcontroller susceptibility to impulsive electromagnetic disturbances" Electromagnetic compatibility symposium proceedings pp53-57 Digest 97.
4. Steffen Wendsche, Ralf Vick, "Modeling and testing of immunity of computerized equipment to fast electrical transients" IEEE transaction on EMC vol 41 no 4 Nov 1999 pp 452-459.
5. Vick, R. Habiger, E "The influence of hardware and software structure on the immunity of microcontroller to external electromagnetic impulsive disturbances" Proc. EMC ROMA '96", Int. Symp. on EMC;17-20.9. 1996, pp. 227-232.
6. S. Wendsche, E. Habiger "Using a reinforcement method for statistical estimation of worst case immunity of computerized equipment" Proc. EMC ROMA '96", Int. Symp. on EMC;17-20.9. 1996, pp. 600-604.
7. International Standard IEC61000-4-4 Part 4: Testing and measurement techniques- section 4:Electrical fast transient/burst immunity test.
8. International Standard IEC61000-4-2: Testing and measurement techniques Electrostatic discharge immunity test