Modeling and testing of immunity of computerized equipment to fast electrical transients

IEEE Transactions on Electromagnetic Compatibility

Volumn 41, Issue 4 PART 2, 1999, Pages 452-459

  Wendsche, Steffen ^b   Vick, Ralf ^a,c   Habiger, Ernst ^d  

^a IEEE

^b Anderson Consulting   (Germany)

^c EMV Beratungs und Planungsbuero   (Germany)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Immunity testing; Statistical modeling; Time variant susceptibility

Indexed keywords

INTEGRATED CIRCUIT TESTING; LEARNING ALGORITHMS; LEARNING SYSTEMS; MATHEMATICAL MODELS; PROBABILITY; STATISTICAL METHODS; TRANSIENTS;

IMMUNITY TESTING; TIME-VARIANT SUSCEPTABILITY;

MICROCONTROLLERS;

EID: 0033220831     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.809848     Document Type: Article

References (8)

1. R. Vick, "The influence of hardware and software structure on the immunity of digital equipment (Die abhängigkeit der störfestigkeit digitaler geräte von den internen funktionsabläufen)" Tech. Univ., Dresden, Germany, Ph.D. dissertation, 1995, (in German).
2. S. Wendsche, "Immunity of computer controlled equipment to impulsive disturbances-immunity tests by using statistical and adaptive methods (Störfestigkeit computerbasierter geräte gegenüber pulsförmigen störgrößen-statistische modellierung und störfestigkeitsprüfung mit statistischen und selbstadaptiven methoden)," Tech. Univ., Dresden, Germany, Ph.D. dissertation, 1996.
3. R. G. Renninger, "Optimized statistical method for system-level ESD tests," in Proc. IEEE Int. EMC Symp., Anaheim, CA, Aug. 1992, pp. 474-484.
4. ANSI C63.16-1991 (draft), "Guide for electrostatic discharge test methodologies and criteria for electronic equipment," 1991.
5. F. Schreiber, "The Bayes-Laplace statistic of the multinomial distribution," AEÜ vol. 39, vol. 5, pp. 293-298, 1985.
6. H. H. Nick, B. E. Osborn, and C. Y. Wu, "Diagnostic effectiveness in computer systems using deterministic and random ESD," in Proc. Int. Symp. EMC, Washington, DC, Aug. 1990, pp. 274-279.
7. L. P. Kaelbling, Learning in Embedded Systems - A Bradford Book. Cambridge, MA: MIT Press, 1993.
8. IEC 61000-4-4, "Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques," sec. 4, 1995.