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Volumn 1447, Issue 1, 2012, Pages 709-710
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Crystalline behaviour of SnS layers produced by sulfurization of Sn films using H2S
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Author keywords
SnS films; Structural properties; X ray diffraction
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Indexed keywords
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EID: 84876808184
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.4710200 Document Type: Conference Paper |
Times cited : (4)
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References (5)
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