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Volumn 1447, Issue 1, 2012, Pages 709-710

Crystalline behaviour of SnS layers produced by sulfurization of Sn films using H2S

Author keywords

SnS films; Structural properties; X ray diffraction

Indexed keywords


EID: 84876808184     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.4710200     Document Type: Conference Paper
Times cited : (4)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.