An automatic measurement algorithm for the diameters of carbon nanotubes by using image processing

Technological Developments in Networking, Education and Automation

Volumn , Issue , 2010, Pages 275-280

  Iwasaki, Yoichiro ^a   Nakamiya, Toshiyuki ^a   Kozai, Ryosuke ^a   Mitsugi, Fumiaki ^b   Ikegami, Tomoaki ^b  

^a TOKAI UNIVERSITY   (Japan)

^b KUMAMOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY IMAGES; DISCRIMINANT ANALYSIS; SCANNING ELECTRON MICROSCOPY;

AUTOMATIC MEASUREMENTS; DIAMETER MEASUREMENT; DISCRIMINANT ANALYSIS METHODS; ELECTRON MICROSCOPY IMAGES; IMAGE BINARIZATION; MULTI-WALLED CNTS; PREPARATION PROCESS; WIDE MEASUREMENT;

CARBON NANOTUBES;

EID: 84876514270     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-90-481-9151-2_48     Document Type: Conference Paper

References (6)

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