Influence of fluoride-doped tin oxide interlayer on Ni-Sb-SnO 2/Ti electrodes

Journal of Solid State Electrochemistry

Volumn 17, Issue 5, 2013, Pages 1303-1309

  Li, Guo ^a   Wang, Yun Hai ^a   Chen, Qing Yun ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Crystal structure; FTO; Lifetime; Morphology; NATO

Indexed keywords

ACCELERATED LIFETIME TESTS; ELECTROCHEMICAL BEHAVIORS; FTO; LIFETIME; LIFETIME ENHANCEMENT; MORPHOLOGY AND CRYSTAL STRUCTURES; NATO; X-RAY DIFFRACTION TECHNIQUES;

CRYSTAL STRUCTURE; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; FLUORINE COMPOUNDS; MORPHOLOGY; NICKEL; SCANNING ELECTRON MICROSCOPY; TIN; TIN OXIDES; TITANIUM; X RAY DIFFRACTION;

ELECTRODES;

EID: 84876481715     PISSN: 14328488     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10008-013-1997-3     Document Type: Article

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