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Volumn , Issue , 2012, Pages

Evaluation of the openness of automation tools for interoperability in engineering tool chains

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION ENGINEERING; AUTOMATION TOOLS; ENGINEERING EFFICIENCY; ENGINEERING TOOLS; INDUSTRIAL SOFTWARE; OBJECTIVE CRITERIA; TIME BASED;

EID: 84876351090     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETFA.2012.6489542     Document Type: Conference Paper
Times cited : (30)

References (13)
  • 1
    • 38149064591 scopus 로고    scopus 로고
    • Automatic model-driven approach for designing industrial control systems
    • 0302-9743 (Print) 1611-3349 (Online). Vol. 4758/2007, Springer
    • E. Estévez, M. Marcos: Automatic Model-driven approach for designing industrial control systems. Lecture Notes in Computer Science. 0302-9743 (Print) 1611-3349 (Online). Vol. 4758/2007, 2007, pp: 284-287. Springer
    • (2007) Lecture Notes in Computer Science , pp. 284-287
    • Estévez, E.1    Marcos, M.2
  • 3
    • 81255188083 scopus 로고    scopus 로고
    • Software support for building automation requirements engineering - An application of semantic web technologies in automation
    • DOI: 10.1109/TII.2011.2166784
    • S. Runde, A. Fay: Software Support for Building Automation Requirements Engineering - An Application of Semantic Web Technologies in Automation. IEEE Transactions on Industrial Informatics, 2011. DOI: 10.1109/TII.2011.2166784.
    • (2011) IEEE Transactions on Industrial Informatics
    • Runde, S.1    Fay, A.2
  • 10
    • 56349083522 scopus 로고    scopus 로고
    • The system-independent data exchange format caex for supporting an automatic configuration of a production monitoring and control system
    • M. Ebel, R. Drath, O. Sauer, The system-independent data exchange format CAEX for supporting an automatic configuration of a production monitoring and control system, In: Proc. "IEEE Int. Sym. on Industrial Electronics (ISIE 2008)", 2008, pp. 1786-1791.
    • (2008) Proc. IEEE Int. Sym. on Industrial Electronics (ISIE 2008) , pp. 1786-1791
    • Ebel, M.1    Drath, R.2    Sauer, O.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.