Novel wavelength-dispersive X-ray fluorescence spectrometer

Journal of Physics: Conference Series

Volumn 425, Issue PART 15, 2013, Pages

  Firsov, A ^a   Erko, A ^a   Senf, F ^a   Rehanek, J ^a   Brzhezinskaya, M ^a   Wernet, R Mitzner Ph ^a   Fohlisch A ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; MANGANESE; SPECTROMETERS; SYNCHROTRON RADIATION; SYNCHROTRONS;

ABSOLUTE EFFICIENCIES; ANGULAR ACCEPTANCE; ENERGY RESOLUTIONS; FLUORESCENCE LINES; HELMHOLTZ; REFLECTION ZONES; WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCES;

X RAY SPECTROMETERS;

EID: 84876251195     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/425/15/152013     Document Type: Conference Paper

References (6)

1. Erko A, Firsov A and Holldack K 2010 AIP Conf. Proc. vol 1234 p 177-180
2. Rehanek J, Schäfers F, Erko A, Scheer M, Freund W, Grünert J, Ozkan C and Molodtsov S 2011 Proc. SPIE 8141 814109
3. Erko A, Firsov A and Senf F 2012 Spectrochim. Acta B 67 57-63
4. Jia JJ et al 1995 Rev Sci Instrum 66 1394-7
5. Fuchs O et al 2009 Rev Sci Instrum 80 063103
6. Schäfers F and Krumrey M 1996 Technical Report BESSY Technischer Bericht 201