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Volumn 8141, Issue , 2011, Pages

Simulations of diagnostic spectrometers for the European XFEL using the ray-trace tool RAY

Author keywords

Crystal monochromator; Raytracing; Reflection zone plate; Spectrometer; XFEL

Indexed keywords

ANALYZER CRYSTALS; CRYSTAL MONOCHROMATORS; FOCUSING MIRRORS; GERMANY; ONE STEP; OPTICAL SCHEME; PHASE TUNING; PHOTON BEAMS; RAY TRACING SIMULATION; RAY-TRACE; REFLECTION ZONE PLATE; REFLECTION ZONES; SELF-AMPLIFIED SPONTANEOUS EMISSION; SINGLE-SHOT; SPONTANEOUS RADIATION; X-RAY FREE ELECTRON LASERS; X-RAY MONOCHROMATOR; XFEL;

EID: 80054069389     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.906038     Document Type: Conference Paper
Times cited : (6)

References (11)
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  • 4
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    • Makina Yabashi et al., "Single-shot Spectrometry for X-Ray Free-Electron Lasers", Physical Review Letters 97, 084802 (2006)
    • (2006) Physical Review Letters , vol.97 , pp. 084802
    • Yabashi, M.1
  • 6
    • 80054089624 scopus 로고    scopus 로고
    • Section 2: Synchrotron radiation
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    • Kim, K.-J.1
  • 7
    • 80054061798 scopus 로고    scopus 로고
    • Open announcement of simulation code benchmark
    • 2010 - updated
    • Gianluca Geloni, "Open Announcement of Simulation Code Benchmark", European XFEL, (2010 - updated 2011)
    • (2011) European XFEL
    • Geloni, G.1
  • 8
    • 80054072693 scopus 로고    scopus 로고
    • Photon diagnostics requirements and challenges at the European XFEL
    • Liverpool, UK
    • Jan Gruenert, "Photon diagnostics requirements and challenges at the European XFEL", Proceedings of FEL2009, Liverpool, UK, MPOC56, (2009)
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    • Gruenert, J.1
  • 9
    • 80054084626 scopus 로고    scopus 로고
    • Preliminary qualification of invasive diagnostic devices for the european XFEL: Undulator commissioning spectrometer and x-ray backscatter based intensity-profile monitor
    • September
    • Wolfgang Freund et al., "Preliminary Qualification of Invasive Diagnostic Devices for the European XFEL: Undulator Commissioning Spectrometer and X-ray Backscatter based Intensity-Profile Monitor", Proposal for DORIS/PETRAIII: Methods and Instrumentation, (September 2011)
    • (2011) Proposal for DORIS/PETRAIII: Methods and Instrumentation
    • Freund, W.1
  • 10
    • 85060471464 scopus 로고    scopus 로고
    • Undulator commissioning spectrometer for the European XFEL
    • th)
    • Wolfgang Freund et al., "Undulator commissioning spectrometer for the European XFEL", poster presentation, European XFEL Users Meeting, Hamburg, Germany (January 26th - 28th, 2011)
    • (2011) European XFEL Users Meeting
    • Freund, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.