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Journal of Physics: Conference Series

Volumn 425, Issue PART 14, 2013, Pages

Synchrotron infrared confocal microscope: Application to infrared 3D spectral imaging

(5) Jamme, F a,b Lagarde, B a Giuliani, A a,b Garcia, G A a Mercury, L c

a SYNCHROTRON SOLEIL (France)

b CEMAGREF (France)

c STATION DE RADIOASTRONOMIE DE NANÇAY (France)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH PROFILING; DIFFRACTION; INFRARED IMAGING; MICROSCOPES; MIRRORS; PHASE INTERFACES; SPECTROSCOPY; SYNCHROTRON RADIATION; TERAHERTZ WAVES;

DIFFRACTION EFFECTS; DIFFRACTION LIMITS; INFRARED CHEMICAL IMAGING; INFRARED MEASUREMENTS; INFRARED MICROSCOPE; SCHWARZSCHILD OBJECTIVE; SYNCHROTRON SOURCE; WATER-SOLID INTERFACES;

SYNCHROTRONS;

EID: 84876250058 PISSN: 17426588 EISSN: 17426596 Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/425/14/142002 Document Type: Conference Paper

Times cited : (13)

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