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Volumn 49, Issue 1-2, 2006, Pages 152-160
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Synchrotron infrared microscopy at the French Synchrotron Facility SOLEIL
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Author keywords
[No Author keywords available]
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Indexed keywords
INFRARED SPECTROSCOPY;
LIGHT PROPAGATION;
OPTIMIZATION;
RADIATION EFFECTS;
RAY TRACING;
SYNCHROTRON RADIATION;
TEST FACILITIES;
BENDING MAGNET RADIATION;
OPTICAL PARAMETERS;
PHOTON MASKS;
SYNCHROTRON INFRARED MICROSCOPY;
MICROSCOPIC EXAMINATION;
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EID: 33748610787
PISSN: 13504495
EISSN: None
Source Type: Journal
DOI: 10.1016/j.infrared.2006.01.030 Document Type: Article |
Times cited : (96)
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References (5)
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