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Volumn , Issue , 2013, Pages 744-748

Detecting counterfeit products using supply chain event mining

Author keywords

Counterfeiting; EPCglobal; EPCIS; Frequent pattern mining; Radiofrequency identification; Sequential pattern mining; Supply Chain

Indexed keywords

COUNTERFEITING; EPCGLOBAL; EPCIS; FREQUENT PATTERN MINING; SEQUENTIAL-PATTERN MINING;

EID: 84876237767     PISSN: 17389445     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (12)
  • 1
    • 84876261373 scopus 로고    scopus 로고
    • ETH Zurich, SAP Research. Problem-Analysis Report on Counterfeiting and Illicit Trade". Deliverable 5.1 of EU-BRIDGE Project, 2007
    • ETH Zurich, SAP Research. "Problem-Analysis Report on Counterfeiting and Illicit Trade". Deliverable 5.1 of EU-BRIDGE Project, http://bridgeproject. eu/dataiFileIBRlDGE%20WP05%20%20AntiCounterfeiting% 20Problem%20Analysis. pdf. 2007.
  • 2
    • 84876232294 scopus 로고    scopus 로고
    • EPCglobal Inc. EPC Information Services (EPCIS) Version 1.0.1 Specification http://www.gsl.org/epcglobal. , 2007
    • EPCglobal Inc. "EPC Information Services (EPCIS) Version 1.0.1 Specification", http://www.gsl.org/epcglobal. http://www.gsl.org/gsmp/kc/ epcglobal/epcis/epcis -1-0 -I-standard-2007092 I. pdf, 2007.
  • 7
    • 34547335088 scopus 로고    scopus 로고
    • Frequent pattern mining: Current status and future directions
    • Han, H. Cheng, D. Xin, X. Yan, "Frequent pattern mining: current status and future directions", Data Mining and Knowledge Discovery archive Volume 15 Issue 1, pp. 55-86, 2007.
    • (2007) Data Mining and Knowledge Discovery Archive , vol.15 , Issue.1 , pp. 55-86
    • Cheng, H.H.1    Xin, D.2    Yan, X.3
  • 12
    • 23844553153 scopus 로고    scopus 로고
    • TSP: Mining top-k closed sequential patterns
    • P. Tzvetkov, X. Yan, 1. Han, "TSP: Mining top-k closed sequential patterns", Knowledge and Information Systems, Volume 7, Issue 4, pp. 438-457, 2005
    • (2005) Knowledge and Information Systems , vol.7 , Issue.4 , pp. 438-457
    • Tzvetkov, P.1    Yan, X.2    Han, I.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.