TSP: Mining top-k closed sequential patterns

Knowledge and Information Systems

Volumn 7, Issue 4, 2005, Pages 438-457

  Tzvetkov, Petre ^a   Yan, Xifeng ^a   Han, Jiawei ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

Closed pattern; Frequent pattern; Sequence; Top k

Indexed keywords

INFORMATION SYSTEMS;

CLOSED PATTERN; CLOSED SEQUENTIAL PATTERNS; COMPACT REPRESENTATION; DATA MINING COMMUNITY; FREQUENT PATTERN; SEQUENCE; SEQUENTIAL PATTERNS; SEQUENTIAL-PATTERN MINING;

DATA MINING;

EID: 23844553153     PISSN: 02191377     EISSN: 02193116     Source Type: Journal    
DOI: 10.1007/s10115-004-0175-4     Document Type: Article

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