Characterization of high-dimensional entangled systems via mutually unbiased measurements

Physical Review Letters

Volumn 110, Issue 14, 2013, Pages

  Giovannini, D ^a   Romero, J ^a,b   Leach, J ^c   Dudley, A ^d   Forbes, A ^d,e   Padgett, M J ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^c HERIOT WATT UNIVERSITY   (United Kingdom)

^d DSI CSIR Nanotechnology Innovation Centre   (South Africa)

^e UNIVERSITY OF KWAZULU NATAL   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREE OF FREEDOM; ENTANGLED SYSTEM; HIGH-DIMENSIONAL SYSTEMS; MULTIPARTITE QUANTUM SYSTEMS; MUTUALLY UNBIASED BASIS; ORBITAL ANGULAR MOMENTUM; PHYSICAL SOCIETIES; QUANTUM STATE RECONSTRUCTION;

PHOTONS; QUANTUM ELECTRONICS; QUANTUM OPTICS;

QUANTUM ENTANGLEMENT;

EID: 84875980214     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.110.143601     Document Type: Article

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