Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique

Journal of Alloys and Compounds

Volumn 566, Issue , 2013, Pages 83-89

  Gullu H H ^a   Bayrakli, O ^a   Candan, I ^a   Coskun E ^a,b   Parlak, M ^a  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

^b ÇANAKKALE ONSEKIZ MART UNIVERSITY   (Turkey)

Author keywords

Crystal structure; Optical properties; Optical spectroscopy; Thin films; X ray diffraction

Indexed keywords

ANNEALING TEMPERATURES; ENERGY DISPERSIVE X-RAY; OPTICAL SPECTROSCOPY; POLYCRYSTALLINE STRUCTURE; SINGLE-OSCILLATOR MODEL; STRUCTURAL AND OPTICAL PROPERTIES; THERMAL EVAPORATION TECHNIQUE; TRANSMITTANCE MEASUREMENTS;

ANNEALING; CRYSTAL STRUCTURE; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION; ZINC;

OPTICAL PROPERTIES;

EID: 84875951991     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2013.03.030     Document Type: Article

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