Determination of trace rare earth impurities in tantalum pentaoxide by electrothermal vaporization ICP-MS using in situ volatilization for matrix removal

Atomic Spectroscopy

Volumn 34, Issue 1, 2013, Pages 1-5

  Chen, Shizhong ^a   Zhu, Shengping ^b   Lu, Dengbo ^a  

^a WUHAN POLYTECHNIC UNIVERSITY   (China)

^b YUNYANG TEACHERS COLLEGE   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84875883026     PISSN: 01955373     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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