메뉴 건너뛰기




Volumn 27, Issue , 2012, Pages 567-572

Epoxy-induced spalling of silicon

Author keywords

Controled spalling; Kerf free wafering

Indexed keywords


EID: 84875872318     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2012.07.111     Document Type: Conference Paper
Times cited : (37)

References (10)
  • 2
    • 0036957772 scopus 로고    scopus 로고
    • Lifetime and efficiency limits of crystalline silicon solar cells
    • New Orleans, Louisiana, USA
    • M. J. Kerr, P. Campbell and A. Cuevas, Lifetime and efficiency limits of crystalline silicon solar cells, 29th IEEE Photovoltaic Specialist Conference, New Orleans, Louisiana, USA, 2002, pp. 438-441
    • (2002) 29th IEEE Photovoltaic Specialist Conference , pp. 438-441
    • Kerr, M.J.1    Campbell, P.2    Cuevas, A.3
  • 3
    • 46749126512 scopus 로고    scopus 로고
    • A novel approach for recycling of kerf loss silicon from cutting slurry waste doe solar cell applications
    • T. Y. Wang, Y. C. Lin, C. Y. Tai, R. Sivakumar, D. K. Rai, C. W. Lan, A novel approach for recycling of kerf loss silicon from cutting slurry waste doe solar cell applications, Journal of Crystal Growth 2008; 310:3403-3406
    • (2008) Journal of Crystal Growth , vol.310 , pp. 3403-3406
    • Wang, T.Y.1    Lin, Y.C.2    Tai, C.Y.3    Sivakumar, R.4    Rai, D.K.5    Lan, C.W.6
  • 4
    • 78650080438 scopus 로고    scopus 로고
    • Kerf-Free wafering: Technology overview and challenges for thin PV manufacturing
    • Honululu, Hawaii
    • F. Henley, Kerf-free wafering: Technology overview and challenges for thin PV manufacturing, 35th IEEE Photovoltaic Specialist Conference, Honululu, Hawaii, 2010, pp. 1184-1192
    • (2010) 35th IEEE Photovoltaic Specialist Conference , pp. 1184-1192
    • Henley, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.