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Volumn 84, Issue 3, 2013, Pages
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Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines
a a a a b b b c,d c a |
Author keywords
[No Author keywords available]
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Indexed keywords
CONDUCTIVE DIAMONDS;
DIFFRACTION EFFECTS;
EUROPEAN SYNCHROTRON RADIATION FACILITIES;
EXPERIMENTAL DATUM;
EXTENDED X-RAY ABSORPTION FINE STRUCTURES;
FREE-STANDING DIAMOND FILMS;
QUANTITATIVE AGREEMENT;
TRANSMITTED BEAMS;
DIAMOND FILMS;
DICHROISM;
EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;
GOLD;
X RAYS;
MULTILAYERS;
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EID: 84875790023
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.4794439 Document Type: Article |
Times cited : (8)
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References (13)
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