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Volumn 84, Issue 3, 2013, Pages

Thin conductive diamond films as beam intensity monitors for soft x-ray beamlines

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE DIAMONDS; DIFFRACTION EFFECTS; EUROPEAN SYNCHROTRON RADIATION FACILITIES; EXPERIMENTAL DATUM; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FREE-STANDING DIAMOND FILMS; QUANTITATIVE AGREEMENT; TRANSMITTED BEAMS;

EID: 84875790023     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4794439     Document Type: Article
Times cited : (8)

References (13)
  • 9
    • 84875791710 scopus 로고    scopus 로고
    • also available at http://ulisse.elettra.trieste.it/services/elements/ WebElements.html.
  • 11
    • 84875781785 scopus 로고    scopus 로고
    • also available at http://henke.lbl.gov/optical-constants/.
  • 13
    • 84875763827 scopus 로고    scopus 로고
    • See for CCL Diamond
    • See http://ccl-diamond.com for CCL Diamond.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.