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Volumn , Issue , 2012, Pages 255-260

An intelligent approach using SVM to enhance turn-to-turn fault detection in power transformers

Author keywords

internal turn to turn faults; support vector machines; Transformer protection

Indexed keywords

CLASSIFICATION TECHNIQUE; DIFFERENTIAL ALGORITHMS; INRUSH PHENOMENA; INTELLIGENT TECHNIQUES; PSCAD/EMTDC; RELIABLE DETECTION; TURN-TO-TURN FAULTS;

EID: 84875607200     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPEC.2012.6474961     Document Type: Conference Paper
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.