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Volumn 8417, Issue , 2012, Pages
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Application of image entropy evaluation function for the leveling of large aperture components in auto defects detecting
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Author keywords
Defect detection; focusing; image entropy; large aperture components; leveling
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Indexed keywords
DARK-FIELD SCATTERINGS;
DEFECT DETECTION;
DIGITAL IDENTIFICATION;
EVALUATION FUNCTION;
FOCUSING EVALUATION FUNCTIONS;
IMAGE ENTROPY;
IMAGE INFORMATION ENTROPY;
LARGE APERTURE;
CURVE FITTING;
FOCUSING;
IMAGING SYSTEMS;
LEVELING (MACHINERY);
MANUFACTURE;
OPTICAL TESTING;
MICROSCOPES;
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EID: 84875589298
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.976036 Document Type: Conference Paper |
Times cited : (2)
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References (7)
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