Influence of the memory effect on X-ray photoelectron spectroscopy and raman scattering in positive electrode of Ni-Mh batteries

Journal of the Electrochemical Society

Volumn 159, Issue 12, 2012, Pages

  Watanabe, Nobuaki ^a   Arakawa, Tomiyuki ^a   Sasaki, Yasushi ^a   Yamashit, Tsugito ^a   Koiwab, Ichiro ^a  

^a KANTO GAKUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE-DISCHARGE PROCESS; MEMORY EFFECTS; NI-MH BATTERIES; NICKEL METAL HYDRIDE BATTERY; OXIDE ELECTRODES; PEAK INTENSITY; POSITIVE ELECTRODES; REDOX MECHANISM;

ELECTRODES; PHOTOELECTRONS; PROTONS; RAMAN SCATTERING; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYACRYLONITRILES;

EID: 84875551686     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.040212jes     Document Type: Article

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