Explosive detection using pixellated X-ray diffraction (PixD)

Journal of Instrumentation

Volumn 8, Issue 3, 2013, Pages

  O'Flynn, D ^a   Reid, C B ^a   Christodoulou, C ^a   Wilson, M D ^b   Veale, M C ^b   Seller, P ^b   Hills, D ^c   Desai, H ^c   Wong, B ^d   Speller, R ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c Centre for Applied Science and Technology   (United Kingdom)

^d Great Minster House ^*  (United Kingdom)

Author keywords

Data processing methods; Detection of explosives; Pixelated detectors and associated VLSI electronics; X ray diffraction detectors

Indexed keywords

DATA PROCESSING METHODS; DETECTION OF EXPLOSIVE MATERIALS; DETECTION OF EXPLOSIVES; DIFFRACTION TECHNIQUES; ENERGY DISPERSIVE X-RAY DIFFRACTIONS; METHOD OF PROCESSING; PRINCIPAL COMPONENTS; VLSI ELECTRONICS;

DATA HANDLING; DISCRIMINANT ANALYSIS; EXPLOSIVES; EXPLOSIVES DETECTION; PRINCIPAL COMPONENT ANALYSIS; X RAY DIFFRACTION;

DETECTORS;

EID: 84875527320     PISSN: None     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/8/03/P03007     Document Type: Article

References (11)

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