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Volumn 6, Issue 12, 2011, Pages
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Multivariate analysis of pixelated diffraction data
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Author keywords
Pixelated detectors and associated VLSI electronics; X ray diffraction detectors
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Indexed keywords
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EID: 84855471697
PISSN: None
EISSN: 17480221
Source Type: Journal
DOI: 10.1088/1748-0221/6/12/C12027 Document Type: Article |
Times cited : (10)
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References (8)
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