Microwave TM010 cavities as versatile 4D electron optical elements

Ultramicroscopy

Volumn 127, Issue , 2013, Pages 19-24

  Pasmans, P L E M ^a   van den Ham, G B ^a   Dal Conte, S F P ^a   van der Geer, S B ^a   Luiten, O J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Electron optics; Resonant microwave cavities; Ultrafast electron diffraction

Indexed keywords

FIELD AMPLITUDES; PARTICLE TRACKING; RESONANT MICROWAVE; RESONANT MICROWAVE CAVITY; TEMPERATURE STABILITY; TIME-DEPENDENT; ULTRAFAST ELECTRON DIFFRACTION; ULTRASHORT PULSED BEAMS;

ELECTRON OPTICS; PHASE STABILITY;

OPTICS;

ACTION POTENTIAL; ARTICLE; CONTROLLED STUDY; DYNAMICS; ELECTRIC FIELD; ELECTROMAGNETIC FIELD; ELECTRON; ENERGY TRANSFER; EVOKED RESPONSE; FEMTOSECOND PHOTOEMISSION; MICROWAVE RADIATION; OPTICS; PARTICLE SIZE; PHASE TRANSITION; POWER SUPPLY; RADIOFREQUENCY; SIMULATION; THERMOSTABILITY;

EID: 84875506628     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.011     Document Type: Article

References (23)

1. LeBeau J.M., Findlay S.D., Allen L.J., Stemmer S. Nano Letters 2010, 10:4405-4408.
2. Siwick B.J., Dwyer J.R., Jordan R.E., Dwayne Miller R.J. Science 2003, 302:1382-1385.
3. Srinivasan R., Lobastov V.A., Ruan C.-Y., Zewail A.H. Helvetica Chimica Acta 2003, 86:1763-1838.
4. King W.E., Campbell G.H., Frank A., Reed B., Schmerge J.F., Siwick B.J., Stuart B.C., Weber P.M. Journal of Applied Physics 2005, 97:111101.
5. Dwyer J.R., Hebeisen C.T., Ernstorder R., Harb M., Deyirmenjian V.B., Jordan R.E., Miller R.J.Dwayne Philosophical Transactions of the Royal Society of London Series A 2006, 364:741-778.
6. Zewail A.H. Science 2010, 328:187-193.
7. Musumeci P., Moody J.T., Scoby C.M., Gutierrez M.S., Westfall M., Li R.K. Journal of Applied Physics 2010, 108:114513.
8. Eichberger M., Schäfer H., Krumova M., Beyer M., Demsar J., Berger H., Moriena G., Sciani G., Dwayne Miller R.J. Nature 2010, 468:799-802.
9. Siwick B.J., Dwyer J.R., Jordan R.E., Miller R.J.Dwayne Journal of Applied Physics 2002, 92:1643-1648.
10. Reed B.W. Journal of Applied Physics 2006, 100:034916.
11. Michalik A.M., Sipe J.E. Journal of Applied Physics 2006, 99:054908.
12. Berger J.A., Schroeder W.A. Journal of Applied Physics 2010, 108:124905.
13. van Oudheusden T., de Jong E.F., van der Geer S.B., Op 't Root W.P.E.M., Luiten O.J., Siwick B.J. Journal of Applied Physics 2007, 102:093501.
14. van Oudheusden T., Pasmans P.L.E.M., van der Geer S.B., de Loos M.J., van der Wiel M.J., Luiten O.J. Physics Review Letters 2010, 105:264801.
15. L.C. Oldfield, Microwave cavities as electron lenses, PhD Thesis, University Library Cambridge, 1973.
16. Oldfield L.C. Journal of Physics E - Scientific Instruments 1976, 9:455-463.
17. Scherzer O. Zeitschrift für Physik 1936, 101:593-603.
18. Wangler T.P. RF Linear Accelerators 1998, John Wiley & Sons Inc., New York.
19. General Particle Tracer (GPT) code by Pulsar Physics, http://www.pulsar.nl.
20. Reiser M. Theory and Design of Charged Particle Beams 2008, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim. second ed.
21. Kiewiet F.B., Kemper A.H., Luiten O.J., Brussaard G.J.H., van der Wiel M.J. Nuclear Instruments & Methods A 2002, 484:619-624.
22. T. van Oudheusden, Electron source for sub-relativistic single-shot femtosecond diffraction, PhD Thesis, Eindhoven University of Technology Library, 2010.
23. Handbook of Chemistry and Physics, http://www.hbcpnetbase.com.