Improvement of mechanical reliability by patterned silver/Indium-Tin-Oxide structure for flexible electronic devices

Thin Solid Films

Volumn 531, Issue , 2013, Pages 349-353

  Baek, Kyunghyun ^a   Jang, Kyungsoo ^a   Lee, Youn Jung ^a   Ryu, Kyungyul ^a   Choi, Woojin ^a   Kim, Doyoung ^b   Yi, Junsin ^a  

^a Sungkyunkwan University   (South Korea)

^b Ulsan College   (South Korea)

Author keywords

Cracking; Flexible optoelectronic devices; Indium Tin Oxide; Silver; Stress corrosion; Young's modulus

Indexed keywords

DYNAMIC BENDING TEST; FLEXIBLE ELECTRONIC DEVICES; INDIUM TIN OXIDE; MECHANICAL CHARACTERISTICS; MECHANICAL RELIABILITY; OPTICAL CHARACTERISTICS; STRESS CORROSION; YOUNG'S MODULUS;

BENDING TESTS; CRACK INITIATION; ELASTIC MODULI; ELECTRIC PROPERTIES; FLEXIBLE DISPLAYS; INDIUM; OPTOELECTRONIC DEVICES; POLYETHYLENE TEREPHTHALATES; SHEET RESISTANCE; STRESS CORROSION CRACKING; TIN;

SILVER;

EID: 84875423161     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.12.075     Document Type: Article

References (16)

1. H. Kim, C.M. Gilmore, A. Pique, J.S. Horwitz, H. Mattoussi, H. Murata, Z.H. Kafafi, and D.B. Chrisey J. Appl. Phys. 86 1999 6451
2. A. Kloppel, B. Meyer, and J. Trube Thin Solid Films 392 2001 311
3. C. Guillen, and J. Herrero Sol. Energy Mater. Sol. Cells 92 2008 938
4. I. Hamberg, and C.G. Granqvist J. Appl. Phys. 60 1986 R123
5. G.J. Exarhos, and X.D. Zhou Thin Solid Films 515 2007 7025
6. Y. Leterrier, L. Médico, F. Demarco, J.-A.E. Månson, U. Betz, M.F. Escola, M.K. Olsson, and F. Atamny Thin Solid Films 460 2004 156
7. W.A. MacDonald J. Mater. Chem. 14 2004 4
8. M. Sawada, M. Higuchi, S. Kondo, and H. Saka Jpn. J. Appl. Phys., Part 1 40 2001 3332
9. M.K. Sinha, S.K. Mukherjee, B. Pathak, R.K. Paul, and P.K. Barhai Thin Solid Films 515 2006 1753
10. A.A. Abdallah, P.C.P. Bouten, J.M.J. den Toonder, and G. de With Surf. Coat. Technol. 205 2011 3103
11. R.H. Bube Electrons in Solids, an Introductory Survey 1981 Academic New York
12. A.G. Milnes, and D.L. Feucht Heterojunction and Metal Semiconductor Junctions 1972 Academic New York
13. J.S. Kim, B. Lagel, E. Moons, N. Johansson, I.D. Baikis, W.R. Salaneck, R.H. Friend, and F. Cacialli Synth. Met. 311 2000 111
14. K. Sugiyama, H. Ishii, Y. Ouchi, and K. Seki J. Appl. Phys. 87 2000 295
15. G. Haacke J. Appl. Phys. 47 1976 4086
16. K. Röll J. Appl. Phys. 47 1976 3224