A method of multi-objective reliability tolerance design for electronic circuits

Chinese Journal of Aeronautics

Volumn 26, Issue 1, 2013, Pages 161-170

  Zhai, Guofu ^a   Zhou, Yuege ^a   Ye, Xuerong ^a   Hu, Bo ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Design of experiments; Multi objective; Quality cost model; Reliability design; Sensitivity analysis; Tolerance design

Indexed keywords

FAILURE MODE AND EFFECT ANALYSIS; FAULT TREE ANALYSES (FTA); IMPROVE PERFORMANCE; LIGHT-EMITTING DIODE (LED) DRIVERS; MULTI OBJECTIVE; RELIABILITY DESIGN; TOLERANCE DESIGN; WORST-CASE ANALYSIS;

DESIGN; DESIGN OF EXPERIMENTS; FAULT TREE ANALYSIS; FITS AND TOLERANCES; LIGHT EMITTING DIODES; REGRESSION ANALYSIS; SENSITIVITY ANALYSIS;

RELIABILITY;

EID: 84875218532     PISSN: 10009361     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cja.2012.12.005     Document Type: Article

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