Optical properties of CdS thin films

Optical Materials

Volumn 35, Issue 5, 2013, Pages 1112-1117

  Gilic, M ^a   Trajic, J ^a   Romcevic, N ^a   Romcevic, M ^a   Timotijevic, D V ^a   Stanisic, G ^a   Yahia, I S ^b  

^a UNIVERSITY OF BELGRADE   (Serbia)

^b Ain Shams University   (Egypt)

Author keywords

AFM; CdS thin films; Far infrared spectroscopy; Raman spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM SULFIDE; II-VI SEMICONDUCTORS; INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; THERMAL EVAPORATION;

BASE PRESSURE; CDS THIN FILMS; EFFECTIVE PERMITTIVITY; FAR-INFRARED SPECTROSCOPY; MAXWELL-GARNET APPROXIMATION; REFLECTIVITY COEFFICIENTS; SURFACE OPTICAL PHONONS; THERMAL EVAPORATION TECHNIQUE;

THIN FILMS;

EID: 84875215014     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2012.12.028     Document Type: Article

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