High-resolution microfocus X-ray computed tomography for 3d surface roughness measurements of additive manufactured porous materials

Advanced Engineering Materials

Volumn 15, Issue 3, 2013, Pages 153-158

  Kerckhofs, Greet ^a   Pyka, Grzegorz ^a   Moesen, Maarten ^a   Van Bael, Simon ^a   Schrooten, Jan ^a   Wevers, Martine ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

3D SURFACE ROUGHNESS; ACQUISITION PARAMETERS; FLAT SUBSTRATES; MICROFOCUS X-RAY COMPUTED TOMOGRAPHY; NOVEL METHODOLOGY; POROUS STRUCTURES; PROFILING SYSTEMS; ROUGHNESS PARAMETERS;

FOAMS; IMAGE RESOLUTION; METALS; ROUGHNESS MEASUREMENT; SCANNING; SURFACE ROUGHNESS; THREE DIMENSIONAL; THREE DIMENSIONAL COMPUTER GRAPHICS; TWO DIMENSIONAL;

COMPUTERIZED TOMOGRAPHY;

EID: 84875155983     PISSN: 14381656     EISSN: 15272648     Source Type: Journal    
DOI: 10.1002/adem.201200156     Document Type: Article

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