Surface phenomena at metal-carbon nanotube interfaces

Proceedings of the IEEE Conference on Nanotechnology

Volumn 1, Issue , 2003, Pages 252-255

  Ngo, Q ^a   Petranovic, D ^a   Yoong, Hans ^a   Krishnan, S ^a   Yang, C Y ^a  

^a Department of Computer Science and Engineering   (United States)

Author keywords

Carbon nanotubes; Conducting materials; Contact resistance; Electrical resistance measurement; Electrodes; Geometry; Nanostructures; Scanning electron microscopy; Surface resistance; Wires

Indexed keywords

CONTACT RESISTANCE; ELECTRIC RESISTANCE; ELECTRODES; ELECTRON TRANSPORT PROPERTIES; GEOMETRY; INTEGRATED CIRCUIT INTERCONNECTS; METALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM WIRES; SURFACE RESISTANCE; WIRE; YARN;

CONDUCTING MATERIALS; DC CHARACTERISTICS; ELECTRICAL RESISTANCE MEASUREMENT; ELECTRON TRANSPORT; METALLIC CARBON NANOTUBES; ON CHIP INTERCONNECT; SYNTHESIS TECHNIQUES;

CARBON NANOTUBES;

EID: 84875089929     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2003.1231763     Document Type: Conference Paper

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