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Volumn 39, Issue 2, 2013, Pages 360-364

Influence of trace impurities from SF6 new gas on the life of SF6-insulating electrical equipment

Author keywords

Impurity; Life influence; Mass spectrometry detection; New SF6 gas; SF6 electrical equipment; Trace

Indexed keywords

CURRENT VOLTAGE; ELECTRICAL EQUIPMENT; GAS CHROMATOGRAPHY-MASS SPECTROMETRY; LIFE INFLUENCE; POINT DISCHARGES; TRACE; TRACE IMPURITIES; VOLUME CONCENTRATION;

EID: 84875080326     PISSN: 10036520     EISSN: None     Source Type: Journal    
DOI: 10.3969/j.issn.1003-6520.2013.02.016     Document Type: Article
Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.