SCOPUS 정보 검색 플랫폼

Volumn 373, Issue 7, 2002, Pages 639-646

Application of infrared spectroscopy to monitoring gas insulated high-voltage equipment: Electrode material-dependent SF6 decomposition

(4) Kurte, R a Beyer, C a Heise, H M a Klockow, D a

a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V (Germany)

Author keywords

By product monitoring; Fourier transform infrared spectroscopy; Partial least squares calibration; Sulfur hexafluoride decomposition; Trace gas analysis

Indexed keywords

CALIBRATION; DECOMPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INERT GASES; INFRARED SPECTROSCOPY;

GAS INSULATED SUBSTATIONS;

CHEMICAL ANALYSIS;

ALLOY; COPPER; HALIDE; SILVER; STAINLESS STEEL; SULFUR HEXAFLUORIDE; SULFUR OXIDE; TUNGSTEN;

ARTICLE; CALIBRATION; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; DECOMPOSITION; ELECTRIC CONDUCTIVITY; ELECTRODE; ELECTRON MICROSCOPY; ELECTROPHORESIS; GAS; INFRARED SPECTROSCOPY; INTERMETHOD COMPARISON; LABORATORY TEST; MASS SPECTROMETRY; MATERIAL STATE; MICRONUCLEUS; MONITORING; REGRESSION ANALYSIS; SPECTROMETER;

EID: 0036039658 PISSN: 16182642 EISSN: None Source Type: Journal
DOI: 10.1007/s00216-002-1280-4 Document Type: Article

Times cited : (73)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.