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Volumn 42, Issue 2, 2013, Pages 552-563

Patent examination at the State Intellectual Property Office in China

Author keywords

China; Duration; Patent examination; State Intellectual Property Office (SIPO)

Indexed keywords

MULTIVARIANT ANALYSIS;

EID: 84874778718     PISSN: 00487333     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.respol.2012.06.003     Document Type: Article
Times cited : (89)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.