Grazing incidence X-ray diffraction for the study of polycrystalline layers

Thin Solid Films

Volumn 530, Issue , 2013, Pages 9-13

  Simeone, David ^a,b   Baldinozzi, Gianguido ^a,b   Gosset, Dominique ^a,b   Le Caer, Sophie ^c   Bérar, Jean François ^d  

^a DIF   (France)

^b ECOLE CENTRALE PARIS   (France)

^c CEA Saclay   (France)

^d CNRS   (France)

Author keywords

Grazing X ray diffraction; Rietveld refinements; Structure and microstructure of near surface layers

Indexed keywords

BRAGG PEAKS; CHEMICAL COMPOSITIONS; CRITICAL ANGLES; DIFFRACTION CONDITIONS; GD DOPED CERIA; GRAZING INCIDENCE X-RAY DIFFRACTION; GRAZING X-RAY DIFFRACTION; MICRO-STRAIN; NEAR-SURFACE LAYERS; POLYCRYSTALLINE LAYERS; RIETVELD; SI (100) SUBSTRATE; STRAIN FIELDS; TOTAL REFLECTION;

ABERRATIONS; CERIUM COMPOUNDS; DIFFRACTION PATTERNS; INTERFEROMETRY; RIETVELD REFINEMENT;

X RAY DIFFRACTION;

EID: 84874768741     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.07.068     Document Type: Conference Paper

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