Rietveld refinements performed on mesoporous ceria layers at grazing incidence

Journal of Applied Crystallography

Volumn 44, Issue 6, 2011, Pages 1205-1210

  Simeone, David ^a,b   Baldinozzi, Gianguido ^a,b   Gosset, Dominique ^a,b   Zalczer, Gilbert ^c   Bérar, Jean François ^d  

^a CNRS   (France)

^b ECOLE CENTRALE PARIS   (France)

^c DIF   (France)

^d UNIV GRENOBLE ALPES   (France)

Author keywords

ceria layers; grazing incidence X ray scattering; Rietveld refinement

Indexed keywords

ANGLES OF INCIDENCE; ASYMMETRIC REFLECTIONS; BRAGG PEAKS; CRITICAL ANGLES; GD DOPED CERIA; GRAZING INCIDENCE; LARGE SHIFTS; MESOPOROUS; MICRO-STRAIN; RIETVELD; STRUCTURAL MODELS;

CERIUM COMPOUNDS; DIFFRACTION PATTERNS; GADOLINIUM; INTERFEROMETRY; MODEL STRUCTURES; OPTICS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

RIETVELD REFINEMENT;

EID: 82055208258     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811042294     Document Type: Article

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